Measurement options
A wide range of measurement methods are available on the instrument:
- Reflection measurement in Bragg–Brentano geometry (powder and compact samples) for qualitative and quantitative phase analysis as well as real-structure analysis
- Measurement in transmission geometry (film transmission and capillary measurements)
- Measurement using grazing incidence for the investigation of thin films
- Semi-spatially resolved measurements, with a focal spot size between 0.3 mm and 2 mm
- X-ray stress analysis
- texture analysis
- Temperature-dependent measurements up to 1400 °C (investigation of phase transitions, solid-state reactions)
- Small-angle X-ray scattering (SAXS)
A range of software packages is available for data analysis:
- EVA V7 (qualitative phase analysis)
- TOPAS V6 (Rietveld analysis, real-structure analysis)
- LEPTOS V7 (stress analysis)
- TEXTURE V4 (texture analysis)
All measurements are carried out per contract; please contact us if you are interested. Some measurements require modifications to the diffractometer, which – depending on the instrument’s workload – cannot always be carried out immediately. Consequently, there may be waiting time.
Depending on the research question, the data is analysed by the instrument supervisor in collaboration with the user. Users may analyse the data themselves; we are, of course, available to provide assistance. The programmes mentioned can be installed on any computer; network licences are available (within the OvGU network or via VPN).
